诺信 Nordson SMT自动光学检查机 YESTECH M2

设备尺寸(W*D*H): 915mmx1074mmx1494mm

设备重量: 770 kg (1700 lbs)

电源要求: 100-240 VAC, 50/60 Hz, 10 amps

气源要求: 60 to 90 PSI (0.4 to 0.6 Mpa), 2 CFM

设备简介:The M2 offers high-speed microelectronic device inspection with exceptional defect coverage. With resolutions down to submircon levels and telecentric optics, the M2 provides completeinspection, all within a footprint less than 1 sq. meter. 展开更多

设备参数

设备文档

配件清单

Inspection Capabilities
Throughput	75-125 mm² /sec
Maximum inspection area	356mm×320mm×25mm
Device types	JEDEC, MCMs, Hybrids, FlipChip, BGA, microBGA, MEMs, waffle packs

Defects Detected
Wires	Missing, damaged, no stick, off pad, club foot, lifted
Die	Missing, wrong, polarity, chipped, cracked, contamination
Part	Position, missing, wrong, polarity, skew, tombstone
Epoxy	Contamination, insufficient, excessive, bridging
Solder	Contamination, insufficient, excessive, bridging

Software
Algorithms	Color, OCV, OCR, barcode recognition, both image and rule-based algorithms
Data requirements	ASCII Text, X-Y position, part , ref, polarity
CAD translation package	Aegis, Unicam, Fabmaster, YESTECH CAD Utility
Operating system	Windows 10
Off-line software	Optional: Rework, review and program creation
SPC software	Optional: Real-time local and remote Vudata package

Hardware
Material handling	SMEMA width conveyor, pass / fail signals, board clamping
Conveyor length	915 mm
Conveyor height	950mm ± 35 mm
Lighting	Proprietary Fusion Lighting™ multiangle LED
Imaging	M2 Basic: Dual 5 megapixel color camera (0.34 to 9 micron pixel size) resolution 2448 × 2048 M2 Ultra 3D: 5 cameras Ultra High resolution 3D sensor option
Optics	Proprietary high resolution, low distortion with coaxial illumination and optional FV Metrology module
AFVM - Metrology module	FVM - Focus Variation Measurement sensor

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粤ICP备16005436号

粤公网安备 44030602006037号

联系电话：0755-27820151

地址：广东省深圳市宝安区航城大道159号航城创新创业园a1栋510